SN74BCT8374ANTG4

Datasheet:

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IN Stock

Manufacturer:

Texas Instruments

Mfr. Part #:

SN74BCT8374ANTG4

Description:

IC SCAN TEST DEVICE W/FF 24-DIP

Detailed Description:

Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP

Package:

24-DIP (0.300", 7.62mm)

Mfr

Texas Instruments

Product Status

Obsolete

Package / Case

24-DIP (0.300", 7.62mm)

Series

74BCT

Supplier Device Package

24-PDIP

Operating Temperature

0°C ~ 70°C

Logic Type

Scan Test Device with D-Type Edge-Triggered Flip-Flops

Package

Tube

Number of Bits

Supply Voltage

4.5V ~ 5.5V

Mounting Type

Through Hole

Base Product Number

74BCT8374

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