SN74BCT8374ADWRG4

Manufacturer:
Texas Instruments
Mfr. Part #:
SN74BCT8374ADWRG4
Description:
IC SCAN TEST DEVICE 24SOIC
Detailed Description:
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
Package:
24-SOIC (0.295", 7.50mm Width)
Mfr
Texas Instruments
Product Status
Obsolete
Series
74BCT
Operating Temperature
0°C ~ 70°C
Logic Type
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Number of Bits
8
Supply Voltage
4.5V ~ 5.5V
Package
Tape & Reel (TR)
Package / Case
24-SOIC (0.295", 7.50mm Width)
Supplier Device Package
24-SOIC
Base Product Number
74BCT8374
Mounting Type
Surface Mount

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